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  PAUL SCHERRER INSTITUTE

中性子ラジオグラフィ用高分解能テストオブジェクト 
 
 
 

High-Resolution Test Object for Neutron Radiography


Resolution test object consisting of a 30 mm x 30 mm quartz wafer with a patterned layer of gadolinium. The gadolinium thickness is on the order of 5 micrometers in the patterned regions. The patterns will be etched into the gadolinium layer, meaning that the surrounding parts of the sample will be non-transparent. The test pattern ins mounted in a aluminium hoder. The patterns comprise a Siemens-star pattern with the folloing specifications:

- diameter: 20 mm, 128 spokes

- inner period: 40 micrometers

- outer period: 500 micrometers

- radial markers at 50, 100, 200, 300 400, and 500 micrometer period.

The test object will be deliverd in a dedicated storage box.
 


 
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